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  1. Stress-Induced Phenomena in Metallization Stress-Induced Phenomena in Metallization

    Stress-Induced Phenomena in Metallization

    Shinichi Ogawa
    Springer, Berlin

    The conference was on reliability related science in ULSI interconnect. Its main purpose was to d...

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  2. Stress-Induced Phenomena in Metallization Stress-Induced Phenomena in Metallization

    Stress-Induced Phenomena in Metallization

    Ehrenfried Zschech
    Springer, Berlin

    One current challenge to micro- and nanoelectronics is the understanding of stress-related phenom...

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  3. Stress-Induced Phenomena in Metallization Stress-Induced Phenomena in Metallization

    Stress-Induced Phenomena in Metallization

    Paul S. Ho
    Springer, Berlin

    Stress-induced voiding and electromigration have emerged to become key reliability problems for s...

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