Low dielectric constant materials are an important component of microelectronic devices. This com...

Low dielectric constant materials are an important component of microelectronic devices. This com...

'This collection provides a powerful and sophisticated analysis of how environmental movements in...

The conference was on reliability related science in ULSI interconnect. Its main purpose was to d...

One current challenge to micro- and nanoelectronics is the understanding of stress-related phenom...

Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a...

These proceedings contain new research results and advances in basic understanding of stress-indu...

Stress-induced voiding and electromigration have emerged to become key reliability problems for s...

These proceedings present current research on issues related to stress-induced phenomena in on-ch...

Translational Plastic Surgery provides a comprehensive overview reflecting the depth and breadth ...