Low dielectric constant materials are an important component of microelectronic devices. This com...
Low dielectric constant materials are an important component of microelectronic devices. This com...
'This collection provides a powerful and sophisticated analysis of how environmental movements in...
The conference was on reliability related science in ULSI interconnect. Its main purpose was to d...
One current challenge to micro- and nanoelectronics is the understanding of stress-related phenom...
Unser bisheriger Preis:ORGPRICE: 153,50 €
Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a...
Unser bisheriger Preis:ORGPRICE: 127,70 €
These proceedings contain new research results and advances in basic understanding of stress-indu...
Stress-induced voiding and electromigration have emerged to become key reliability problems for s...
Unser bisheriger Preis:ORGPRICE: 124,50 €
These proceedings present current research on issues related to stress-induced phenomena in on-ch...
Translational Plastic Surgery provides a comprehensive overview reflecting the depth and breadth ...