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  1. Der Umgang mit Agilität in der Unternehmenskultur Der Umgang mit Agilität in der Unternehmenskultur

    Der Umgang mit Agilität in der Unternehmenskultur

    Eva-Maria Schön
    Springer Vieweg
    15.09.2023

    In diesem essential wird die Wichtigkeit des erfolgreichen Zusammenspiels von Unternehmenskultur ...

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    14,99 €
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  2. Application of Light Scattering to Coatings Application of Light Scattering to Coatings

    Application of Light Scattering to Coatings

    Michael P. Diebold
    Springer, Berlin, Springer

    The book begins with the fundamentals of light scattering, first by individual particles, then by...

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    128,39 €
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  3. Application of Light Scattering to Coatings Application of Light Scattering to Coatings

    Application of Light Scattering to Coatings

    Michael P. Diebold
    Springer, Springer
    10.09.2016

    The book begins with the fundamentals of light scattering, first by individual particles, then by...

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    99,98 €
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  4. Pigments, Extenders, and Particles in Surface Coatings and Plastics Pigments, Extenders, and Particles in Surface Coatings and Plastics

    Pigments, Extenders, and Particles in Surface Coatings and Plastics

    Michael Diebold
    Springer, Palgrave Macmillan
    06.11.2022

    This book discusses the diverse array of particles that are found in coatings from both a physica...

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    181,89 €
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  5. Pigments, Extenders, and Particles in Surface Coatings and Plastics Pigments, Extenders, and Particles in Surface Coatings and Plastics

    Pigments, Extenders, and Particles in Surface Coatings and Plastics

    Michael Diebold
    Springer, Palgrave Macmillan
    07.11.2023

    This book discusses the diverse array of particles that are found in coatings from both a physica...

    Taschenbuch
    128,39 €
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  6. Frontiers of Characterization and Metrology for Nanoelectronics Frontiers of Characterization and Metrology for Nanoelectronics

    Frontiers of Characterization and Metrology for Nanoelectronics

    David G. Seiler
    Springer, Berlin

    This book contains peer-reviewed papers presented at the 2007 International Conference on Frontie...

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    Unser bisheriger Preis:ORGPRICE: 184,50 €

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  7. Frontiers of Characterization and Metrology for Nanoelectronics Frontiers of Characterization and Metrology for Nanoelectronics

    Frontiers of Characterization and Metrology for Nanoelectronics

    David G. Seiler
    Springer, Berlin

    As the semiconductor industry continues to move toward silicon nanoelectronics and beyond, the in...

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    Unser bisheriger Preis:ORGPRICE: 224,50 €

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